کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1674003 1008956 2007 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging
چکیده انگلیسی

The coherent X-ray diffraction from an isolated strained nano-crystal is given by the Fourier transform of a complex-valued electron density where the modulus and phase are linked to the physical electron density and the displacement field, respectively. The possibility to reconstruct a complex-valued object from a coherent diffraction pattern is demonstrated using iterative algorithms. In the case of a 2D intensity slice, the reconstructed 2D object is strongly dependent on the distribution function of the displacement field values along the direction perpendicular to the observation plane. It is shown that valuable 3D information can, however, still be extracted. This work is of particular interest as soon as the complete 3D measurement is not accessible.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 14, 23 May 2007, Pages 5557–5562
نویسندگان
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