کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1674026 1008956 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study of thermal degradation of organic light emitting device structures by X-ray scattering
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Study of thermal degradation of organic light emitting device structures by X-ray scattering
چکیده انگلیسی

We report the process of thermal degradation of organic light emitting devices (OLEDs) having multilayered structure of [LiF/tris-(8-hydroxyquinoline) aluminum(Alq3)/N,N′-Bis(naphthalen-1-yl)-N,N′-bis(phenyl)benzidine (NPB)/copper phthalocyanine (CuPc)/indium tin oxide (ITO)/SiO2 on a glass] by synchrotron X-ray scattering. The results show that the thermally induced degradation process of OLED multilayers has undergone several evolutions due to thermal expansion of NPB, intermixing between NPB, Alq3, and LiF layers, dewetting of NPB on CuPc, and crystallization of NPB and Alq3 depending on the annealing temperature. The crystallization of NPB appears at 180 °C, much higher temperature than the glass transition temperature (Tg = 96 °C) of NPB. The results are also compared with the findings from the atomic force microscope (AFM) images.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 14, 23 May 2007, Pages 5674–5677
نویسندگان
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