کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1674228 1008960 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Growth and characterization of group-III impurity-doped semiconducting BaSi2 films grown by molecular beam epitaxy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Growth and characterization of group-III impurity-doped semiconducting BaSi2 films grown by molecular beam epitaxy
چکیده انگلیسی

Ga- or In-doped BaSi2 films were grown on Si(111) by molecular beam epitaxy (MBE). The Ga-doped BaSi2 showed n-type conductivity. The electron concentration and resistivity of the Ga-doped BaSi2 depended on the Ga temperature; however, the electron concentration and resistivity could not be controlled properly. In contrast, the In-doped BaSi2 showed p-type conductivity and its hole concentration was controlled in the range between 1016 and 1017 cm− 3 at RT.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 22, 15 August 2007, Pages 8242–8245
نویسندگان
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