Fourier transform photocurrent spectroscopy applied to a broad variety of electronically active thin films (silicon, carbon, organics)

Steady state and low frequency photocurrent spectroscopies have proved as a valuable tool for investigation of many different semiconductors, used for example as an absorber in photovoltaic solar cells or in the large area sensors. Fourier transform photocurrent spectroscopy (FTPS), described here, exhibits advantages as a high sensitivity (we demonstrate dynamical range up to 9 orders of magnitude of the optical absorption coefficient, connected with the absorption process leading to free carriers; or sensitivity for dopant detection better than 1 part-per-billion), fast acquisition of data (it can be of the order of seconds) or high resolution (under more lengthy acquisition of data). Results on amorphous silicon, microcrystalline silicon, diamond layers, nanocrystalline diamond and very thin organic films, as poly(2-methoxy-5-(3′,7′-dimethyl-octyloxy))-p-phenylene-vinylene (MDMO-PPV), regioregular poly(3-hexylthiophene (P3HT) and their blends with (6,6)-phenyl-C61-butyric-acid (PCBM) are reported, together with the results measured on various thin film silicon or polymer solar cells.