کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1674707 1008969 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Development of low temperature approaches to device quality CdS: A modified geometry for solution growth of thin films and their characterisation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Development of low temperature approaches to device quality CdS: A modified geometry for solution growth of thin films and their characterisation
چکیده انگلیسی

Cadmium sulphide thin films have been grown using a modified chemical bath deposition method with four innovative features: i) ethylenediamine was used as the complexing agent, enabling the use of low cadmium concentrations, ii) a rectangular bath geometry with heated glass plate walls was employed, iii) a low deposition temperature (30 °C) was used and iv) nitrogen gas was flowed over the substrate surface during growth. The latter two features eliminate the formation and adherence of gas bubbles on the substrate during growth, hence reducing pinhole formation. On inspection, films were found to be specularly reflective and homogeneous with no visible pinholes. Characterisation was performed by atomic force microscopy, grazing incidence X-ray diffraction, optical transmittance and photoluminescence spectroscopy. It was shown that films possessed a low surface roughness value of 5.2 nm, were highly crystalline, textured, had a grain size of 15 nm and a bandgap of 2.42 eV. Preliminary results from CdTe/CdS thin film photovoltaic devices demonstrate a notable efficiency of 9.8%.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 5, 22 January 2007, Pages 2954–2957
نویسندگان
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