کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1675574 | 1008982 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electronic structure in thin film organic semiconductors studied using soft X-ray emission and resonant inelastic X-ray scattering
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu–Pc we report the observation of two discrete states near EF. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO–Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 2, 25 October 2006, Pages 394–400
Journal: Thin Solid Films - Volume 515, Issue 2, 25 October 2006, Pages 394–400
نویسندگان
Yufeng Zhang, James E. Downes, Shancai Wang, Timothy Learmonth, Lukasz Plucinski, A.Y. Matsuura, Cormac McGuinness, Per-Anders Glans, Sarah Bernardis, Cian O'Donnell, Kevin E. Smith,