کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1675694 | 1518103 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Optical and non-optical characterization of Nb2O5–SiO2 compositional graded-index layers and rugate structures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Optical and non-optical characterization of Nb2O5–SiO2 compositional graded-index layers and rugate structures Optical and non-optical characterization of Nb2O5–SiO2 compositional graded-index layers and rugate structures](/preview/png/1675694.png)
چکیده انگلیسی
The deposition of graded-index layers and rugate structures was performed by coevaporation of silicon dioxide as the low index material and niobium pentoxide as the high index material. To obtain information about the composition depth profile of the films, we used cross-sectional transmission electron microscopy to supplement deposition rate data recorded by two independent crystal quartz monitors during film preparation. The concentration depth profile was transformed to a refractive index profile using the effective medium approximation. The thus obtained refractive index profiles turned out to represent efficient initial approximations for re-engineering purposes.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 497, Issues 1–2, 21 February 2006, Pages 135–141
Journal: Thin Solid Films - Volume 497, Issues 1–2, 21 February 2006, Pages 135–141
نویسندگان
Robert Leitel, Olaf Stenzel, Steffen Wilbrandt, Dieter Gäbler, Vesna Janicki, Norbert Kaiser,