کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1675905 1008985 2007 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study on sulfur diffusion in CuInSe2 thin films using two thermal profiles
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Study on sulfur diffusion in CuInSe2 thin films using two thermal profiles
چکیده انگلیسی
An insurmountable disadvantage of CuInSe2 is the low band gap, which limits the open-circuit voltage to value well below 500 mV in solar cells. The incorporation of sulfur into CuInSe2 thin film was investigated to establish a scientific basis for the graded band gap CuIn(Se1 − x,Sx)2 thin films. CuIn(Se1 − x,Sx)2 thin films were obtained by reactive annealing of Cu11In9 precursors in a mixture of sulfur and selenium atmosphere while post-sulfurization of single phase CuInSe2 did not result in CuIn(Se1 − x,Sx)2 thin films. A band gap of 1.36 eV, was obtained for the prepared CuIn(Se1 − x,Sx)2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 15, 31 May 2007, Pages 6188-6191
نویسندگان
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