کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1675929 | 1518088 | 2006 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Substrate related structural, electronic and electrochemical properties of evaporated CeOx ion storage layers
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Thin CeOx films were deposited on Indium Tin Oxide (ITO) coated glass and on Aluminium (Al) foil using electron beam evaporation. Combined analysis based on various experimental techniques has clearly revealed that the properties of the films are influenced by the substrate on which they are deposited: The CeOx/ITO films have smaller grain size and thus a larger amount of oxygen vacancies under reducing conditions than their CeOx/Al counterparts. Their morphology difference characterizes their behavior during lithiation: The CeOx/ITO films exhibit a Li+ diffusion coefficient of about one order of magnitude higher than that of the CeOx/Al films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 514, Issues 1â2, 30 August 2006, Pages 87-96
Journal: Thin Solid Films - Volume 514, Issues 1â2, 30 August 2006, Pages 87-96
نویسندگان
A. Siokou, S. Ntais, V. Dracopoulos, S. Papaefthimiou, G. Leftheriotis, P. Yianoulis,