کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1676797 1518104 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry
چکیده انگلیسی
Isothermal ellipsometric measurements were carried out under controlled vapour pressure of ethanol from vacuum to saturation on mesostructured anatase-based thin layers. Thin films were prepared by the sol-gel route using the templating effect of lyotropic mesophases. Ellipsometric porosimetry (EP) has been applied for analysing thermally treated films with an ordered mesoporosity resulting from the removal of the template. The EP results are discussed and correlated with those obtained by nitrogen adsorption using a conventional volumetric apparatus and TEM analysis.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 495, Issues 1–2, 20 January 2006, Pages 232-236
نویسندگان
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