کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1677099 | 1518102 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Direct fabrication of large-grain polycrystalline silicon thin films by RF-biased RF-PECVD at low temperature
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Polycrystalline silicon (Poly-Si) films with large grains are successfully fabricated on glasses in a self-assembled RF-biased RF-PECVD tubular system. Both inductively coupled and capacitively coupled RF powers are employed. High purity (99.99%) SiH4, H2 and Ar are introduced as resource gases. All crystalline films obtained in this study exhibit (111)-Si preferred orientation. Poly-Si films with large grains (about 0.15–0.3 mm in size) which are aggregate of fine crystals (about 50 nm in size) are deposited at the deposition temperature less than 77 °C. However, the improvement of crystallinity and the grain size are still under investigation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 498, Issues 1–2, 1 March 2006, Pages 2–8
Journal: Thin Solid Films - Volume 498, Issues 1–2, 1 March 2006, Pages 2–8
نویسندگان
Jian-De Gu, Pei-Li Chen,