کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4639456 | 1632051 | 2013 | 10 صفحه PDF | دانلود رایگان |

An important topic in the manufacturing industries is the assessing of the lifetime performance. In this paper, it is supposed the lifetimes of products are independent and have a common Weibull distribution with a known shape parameter. The lifetime performance index (CLCL) proposed by Montgomery (1985) [1], is used for evaluating the performance of a process with respect to a lower specification limit (LL). The maximum likelihood estimate of CLCL is obtained on the basis of the progressive first-failure censored data. This estimate is then used for developing a confidence interval for CLCL. The behavior of the confidence interval for the parameter CLCL given a significance level is investigated and also two illustrative examples and a sensitivity analysis are given. For the exponential distribution as a special case of Weibull distribution, a comparison study for various estimates of CLCL based on mean squared error (MSE) and Pitman measure of closeness (PMC) criteria is done.
Journal: Journal of Computational and Applied Mathematics - Volume 239, 1 February 2013, Pages 93–102