Excitation-induced processes in model molecular solid - N2

Recent findings on electronically induced processes in N2 molecular solids monitored by luminescence methods are presented with a focus on the electronically induced desorption. Low-energy electron beam was used for excitation to avoid the knock-on defect formation and sputtering. The samples were probed with depth by varying electron energy. VUV photon emissions from desorbing N* atoms (the 4P1/2-5/2→4S3/2 transitions) under irradiation by electrons of subthreshold energy were observed for the first time. Their distinctive feature is a coincidence with the gas phase lines within the experimental error. New data on electronically stimulated desorption of N2* molecules in the electronic excited state C3Πu are reported. Monitoring of nonstationary desorption NsD in combination with the detection of thermally stimulated exoelectron emission TSEE and post-desorption reveal the contribution of charge recombination reactions in the electronically induced particles ejection. Fresh approach to study of electronically induced desorption opens new type of greatly delayed desorption associated with the entry of freeing electrons in recombination process.