کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5466211 | 1517989 | 2017 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Atomic oxygen irradiation resistance of transparent conductive oxide thin films
ترجمه فارسی عنوان
مقاومت به اکسیداسیون اکسید اتمی از فیلم های نازک اکسید رسانا
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کلمات کلیدی
ورقهای نازک اکسید منیزیم تنگستن، ورقهای نازک اکسید منیزیم قلع، اسپکترومغناطیسی مگنترون واکنش پذیر رادیویی، اشباع اکسیژن اتمی، خواص نوری و الکتریکی،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
One set of tungsten-doped indium oxide thin films (In2O3:W, IWO) and another set of tin-doped indium oxide thin films (In2O3:Sn, ITO) were prepared on glass substrates by radio frequency (RF) reactive magnetron sputtering method. The as-deposited IWO and ITO films have resistivity values at a level of 10â 4 Ω
- cm. Average transmittance values of these films are above 85% in visible-light region as well as in near-infrared region. All these films were irradiated by atomic oxygen (AO) with different amount of flux in a ground-based simulation system close to the environment of low Earth orbit. Changes in characteristics including surface morphology, mechanical properties, optical and electrical properties were compared between IWO and ITO films after AO irradiation. The effects of AO irradiation on transparent conductive oxide thin films were analyzed. As a result, AO has influences on ITO and IWO thin films through the way of oxidation and erosion. Both ITO and IWO films possess suitable anti-AO properties. IWO films are more appropriate as AO protective coatings due to their compact microstructure, the coexistence of W4Â + and W6Â + ions in their chemical systems, and incremental WO3 protective layer under AO oxidation.
- cm. Average transmittance values of these films are above 85% in visible-light region as well as in near-infrared region. All these films were irradiated by atomic oxygen (AO) with different amount of flux in a ground-based simulation system close to the environment of low Earth orbit. Changes in characteristics including surface morphology, mechanical properties, optical and electrical properties were compared between IWO and ITO films after AO irradiation. The effects of AO irradiation on transparent conductive oxide thin films were analyzed. As a result, AO has influences on ITO and IWO thin films through the way of oxidation and erosion. Both ITO and IWO films possess suitable anti-AO properties. IWO films are more appropriate as AO protective coatings due to their compact microstructure, the coexistence of W4Â + and W6Â + ions in their chemical systems, and incremental WO3 protective layer under AO oxidation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 623, 1 February 2017, Pages 31-39
Journal: Thin Solid Films - Volume 623, 1 February 2017, Pages 31-39
نویسندگان
Qi Ouyang, Wenwen Wang, Qiang Fu, Dongmei Dong,