کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8033185 1517967 2018 35 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray diffraction and X-ray photoelectron spectroscopy characterization of sulfurized tin thin films deposited by thermal evaporation
ترجمه فارسی عنوان
پراش اشعه ایکس و طیف سنجی فوتوالکترون اشعه ایکس مشخصه های فیلم های نازک سولفوریزه شده با تبخیر حرارتی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
In this paper, we report the structural properties of tin sulfide (SnS) thin films deposited by a technique involving thermal evaporation and sulfurization. X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) were used to determine the crystallinity and elemental composition of the sulfurized tin thin films. With increasing sulfurization temperature, Sn and its native oxide reacted with S, yielding SnS. XRD showed evidence of crystal growth along the SnS [040] direction in films sulfurized at 260 and 300 °C. The growth of SnS crystals was completed at 300 °C, and stoichiometry was the highest. Depth profiles of the composition measured by XPS showed a flat sulfur concentration towards the interior of the film sulfurized at 300 °C. The hole concentration was 1.6 × 1015 cm− 3. The films showed a band gap of 1.2 eV and an absorption coefficient of > 104 cm− 1.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 645, 1 January 2018, Pages 409-416
نویسندگان
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