کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8034625 | 1518027 | 2015 | 23 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Minority carrier traps in Cu(In,Ga)(S,Se)2 solar cells
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
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چکیده انگلیسی
Cu(In,Ga)(S,Se)2 (CIGSSe)/buffer/ZnO:B heterojunction solar cells were fabricated with two different buffers, CdS (Sample A) and Zn(S,O) (Sample B), which were prepared using a chemical bath deposition wet process and an atomic layer deposition dry process, respectively. The diode properties and deep center properties of Samples A and B were examined as current-voltage, capacitance-voltage, and deep-level transient spectroscopy measurements. Two minority N1 (electron) traps were observed in each CIGSSe solar cell, the activation energies of which were 466Â meV and 317Â meV in Sample A and 329Â meV and 247Â meV in Sample B, respectively. The activation energy of the N1 level attributed to the InCu-compensating donors, i.e., InCu (+/++) and InCu (0/+) antisite defects, varies with changes in the electric field and potential distribution within the junction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 578, 2 March 2015, Pages 98-102
Journal: Thin Solid Films - Volume 578, 2 March 2015, Pages 98-102
نویسندگان
In-Hwan Choi,