کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8035445 | 1518054 | 2014 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effects of thickness on the nanocrystalline structure and semiconductor-metal transition characteristics of vanadium dioxide thin films
ترجمه فارسی عنوان
اثر ضخامت بر ساختار نانوکریستال و ویژگی های انتقال نیمه هادی فلز در ورقه های نازک دی اکسید وانادیوم
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کلمات کلیدی
پرتقال، ضخامت انتقال نیمه هادی فلز اندازه دانه، فیلم های نازک نانوکریستالی، دیاکسید وانادیوم،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Nanocrystalline vanadium dioxide (VO2) thin films were grown on glass substrates by using reactive direct current magnetron sputtering and in situ thermal treatments at low preparation temperatures (â¤Â 350 °C). The VO2 thin films were characterized by grazing-incidence X-ray diffraction, field emission scanning electron microscope, transmission electron microscopy and spectroscopic ellipsometry (SE). The semiconductor-metal transition (SMT) characteristics of the films were investigated by four-point probe resistivity measurements and infrared spectrometer equipped with heating pads. The testing results showed that the crystal structure, morphology, grain size and semiconductor-metal transition temperature (TSMT) significantly changed as the film thickness decreased. Multilayer structures were observed in the particles of thinner films whose average particle size is much larger than the film thickness and average VO2 grain size. A competition mechanism between the suppression effect of decreased thickness and coalescence of nanograins was proposed to understand the film growth and the formation of multilayer structure. The value of TSMT was found to decrease as average VO2 grain size became smaller, and SE results showed that small nanograin size significantly affected the electronic structure of VO2 film.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 550, 1 January 2014, Pages 227-232
Journal: Thin Solid Films - Volume 550, 1 January 2014, Pages 227-232
نویسندگان
Zhenfei Luo, Xun Zhou, Dawei Yan, Du Wang, Zeyu Li, Cunbang Yang, Yadong Jiang,