کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8036586 | 1518068 | 2013 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
CeOx/Al2O3 thin films on stainless steel substrate - Dynamical X-ray photoelectron spectroscopy investigations
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The CeOx/Al2O3 thin films on stainless steel with different ceria loading were subjected to a.c. (square wave) pulses at various frequencies in the range 10â 3 to 100 kHz while recording X-ray photoelectron spectra. The resulting binding energy differences were derived from the frequency dependence of the corresponding Al2p, Ce3d and O1s peaks. At low ceria loadings the main constituent on the surface is CeAlO3 phase, while for high ceria loading the film is constructed from CeO2 and CeAlO3 phases spread over the Al2O3. Accordingly, it was observed that the ceria loading determines the conductivities of the investigated thin oxide films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 536, 1 June 2013, Pages 63-67
Journal: Thin Solid Films - Volume 536, 1 June 2013, Pages 63-67
نویسندگان
Ivalina Avramova, Sefik Suzer, Desislava Guergova, Dimitar Stoychev, Plamen Stefanov,