Reduction of the deposition temperature of high quality EuO films on Yttria Stabilized Zirconia by incorporating an MgO buffer layer

► EuO films were epitaxially grown on MgO coated Yttria Stabilized Zirconia. ► Deposition temperature was reduced compared to bare Yttria Stabilized Zirconia. ► Epitaxial texture was confirmed by in-plane X-ray diffraction. ► Composition of the heterostructure was defined by X-ray Photoelectron Spectroscopy. ► Single crystal like EuO magnetic moment and coercive field were measured.