Pseudo-fixed dead time circuit for designing and implementation of JEOL-type X-ray counting systems

Quantitative electron probe microanalysis (EPMA) of trace elements using wavelength dispersive spectrometers (WDS) requires high probe current and/or accelerating voltage and long X-ray sampling times to measure weak X-ray signals from target materials. The X-ray count rate of a standard material is extremely high when measured under the same conditions. Consequently, the accuracy of the dead time correction becomes a significant issue for quantification. Accurate dead time correction requires an exact knowledge of the X-ray counting system, including the behavior of the proportional counter and electronic circuits. Each spectrometer has a specific dead time that depends on factors such as electronic circuit design, counter bias, and X-ray energies. The dead time also changes with aging degradation. A pseudo-fixed dead time correction circuit with non-extendable approximation is described that prevents systematic errors in quantitative EPMA caused by inappropriate dead time corrections. The circuit, which is added to the output of the single channel analyzer, includes one extendable and two non-extendable dead time generators with dead times of 0.68 μs, 1.08 μs, and 1.92 μs, respectively. The behavior of the whole system can be treated as non-extendable for most applications, with a dead time of approximately 2.01 μs. The pseudo-fixed dead time circuit suppresses systematic error of the dead time correction to 0.6% or less when the original dead time is between 0.8-2.0 μs and the true X-ray count rate is < 200 kcps. This makes it possible to perform accurate dead time corrections without periodic measurement of the dead time throughout the life of the proportional counter by implementing a high-precision crystal oscillator in the system.