کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9812060 | 1518106 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Growth mechanism and thermoelectric properties of PbTe/SnTe/PbTe heterostructures
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
An electron microscopy study of the mechanism of SnTe and PbTe layer growth in PbTe/SnTe/PbTe heterostructures prepared by thermal evaporation in vacuum onto a KCl substrate was performed. It is established that PbTe and SnTe grow on one another in a layer-by-layer fashion with the introduction of misfit dislocations on the interface at a critical thickness dc â 2 nm. The experimentally determined dependence of the elastic stress in a growing layer (either PbTe or SnTe) on the layer thickness and the critical thickness are in good agreement with those calculated theoretically. The dependences of the thermoelectric properties of PbTe/SnTe/PbTe heterostructures on the SnTe layer thickness (dSnTe = 5-100 nm) at fixed thicknesses of the PbTe layers were studied at room temperature. It was found that in the thickness range of dSnTe â (10-15) nm, an inversion of the dominant carrier sign from n to p takes place. The d-dependences of the thermoelectric properties were interpreted within the framework of a three-layer model, treating a PbTe/SnTe/PbTe heterostructure as three conductors connected in a parallel fashion, each characterized by its specific electrophysical parameters.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 493, Issues 1â2, 22 December 2005, Pages 41-48
Journal: Thin Solid Films - Volume 493, Issues 1â2, 22 December 2005, Pages 41-48
نویسندگان
E.I. Rogacheva, S.N. Grigorov, O.N. Nashchekina, T.V. Tavrina, S.G. Lyubchenko, A.Yu. Sipatov, V.V. Volobuev, A.G. Fedorov, M.S. Dresselhaus,