کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9812274 | 1518110 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effect of Eu2CuO4/Yttrium-stabilized ZrO2 buffer layers on YB2Cu3O7âx thin films grown on Si substrates
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Effect of Eu2CuO4/Yttrium-stabilized ZrO2 buffer layers on YB2Cu3O7âx thin films grown on Si substrates Effect of Eu2CuO4/Yttrium-stabilized ZrO2 buffer layers on YB2Cu3O7âx thin films grown on Si substrates](/preview/png/9812274.png)
چکیده انگلیسی
The microstructure and crystallinity of epitaxial YB2Cu3O7âx (YBCO) thin films grown on a silicon using a buffer of Eu2CuO4 (ECO)/Yttrium-stabilized ZrO2 (YSZ) were investigated by X-ray high-resolution diffraction, small angle reflection, and reciprocal space map, as well as atomic force microscopy. The results showed that YBCO films with a buffer of ECO/YSZ were well oriented in the [00L] direction perpendicular to the substrate surface. The rocking measurements for the YBCO films grown on ECO/YSZ buffered Si show a smaller value of the full widths at half maximum (â¼2.07°) in comparing with that of the YBCO with a single YSZ buffer (â¼4.48°). Moreover, the surface morphology of YBCO films with an ECO/YSZ buffer is significantly improved. The average size of grains on the surface was much smaller, indicating that growth of YBCO on Si with such a buffer of ECO/YSZ is highly epitaxial.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 489, Issues 1â2, 1 October 2005, Pages 200-204
Journal: Thin Solid Films - Volume 489, Issues 1â2, 1 October 2005, Pages 200-204
نویسندگان
X.L. Li, J. Gao, H.Y. Wong, Z.H. Mai,