کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9812293 1518110 2005 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Ab initio study of the stability of X (X=Cr, Nb, Ag) ultra-thin layers on Cu(001)
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Ab initio study of the stability of X (X=Cr, Nb, Ag) ultra-thin layers on Cu(001)
چکیده انگلیسی
Full potential Linearized Plane Waves method within the framework of the generalized gradient approximation is applied to study X/Cu(001) (X=Cr, Nb, Ag) layered structures. Self-consistent total energy calculations are carried out to determine the energetics and growth modes of different X/Cu(001) systems: interdiffusion, monolayer, bilayer, trilayer, and island formations. Ideal works of separation and the resulting interfacial energies are estimated for the Cr/Cu, Nb/Cu and Ag/Cu layered structures. The obtained results, which are compared with previously published experimental and theoretical data, show that Ag and Nb elements have quite different behavior than Cr.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 489, Issues 1–2, 1 October 2005, Pages 344-349
نویسندگان
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