کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9812332 | 1518111 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Microstructure and current transport properties of single-layer YBa2Cu3O7âx and multiple-layer YBa2Cu3O7âx/(Ba0.05, Sr0.95)TiO3 superconductor films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
YBa2Cu3O7âx (YBCO) films grown by pulsed laser deposition on (100) LaAlO3 substrates show a strong thickness dependence on the electrical properties. Films in excess of 0.3 μm show a critical current density that decreases with increasing thickness. In contrast, nano-composite films, consisting of a stack of alternative YBCO and (Ba0.05, Sr0.95)TiO3 (BSTO) layers with a total thickness of up to 5 μm, show improved electrical properties. In order to understand this phenomenon, a detailed microstructural characterization has been undertaken. Transmission electron microscopy observations show that cracks, stacking faults and grain boundary are present on the single-layer films, while a high-quality microstructure is observed for the nano-composite multiple-layer films although defects at YBCO/BSTO interfaces are still present. In addition, nano-composite films have a reduced surface roughness. In this complex microstructure, the digital Moiré technique reveals that the YBCO/BSTO interfaces play a crucial role in controlling the propagation of defects in YBCO.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 488, Issues 1â2, 22 September 2005, Pages 217-222
Journal: Thin Solid Films - Volume 488, Issues 1â2, 22 September 2005, Pages 217-222
نویسندگان
Y. Luo, R.A. Hughes, J.S. Preston, G.A. Botton,