کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9813046 | 1518124 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
On the AlAs/GaAs (001) interface dielectric anisotropy
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Reflectance anisotropy spectroscopy (RAS/RDS) so far has been mostly used for surface studies on III-V semiconductors. In the work reported here it was applied to the GaAs-AlAs (001) interface for measuring the interface dielectric anisotropy (IDA) by in-situ experiments performed in molecular beam epitaxy (MBE). From the measured RAS spectra of very thin AlAs overlayers (1-40 monolayers) on GaAs(001) the different contribution of surface, bulk and interface were separated. For the analysis, a three-layer model was used consisting of a single AlAs layer sandwiched between a well-separated and anisotropic interface layer and a surface layer. The upper limit for the 'thickness' of the surface and interface layers could be determined. Finally, an improved analytical formula for the deconvolution of surface and interface anisotropies is derived.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 472, Issues 1â2, 24 January 2005, Pages 261-269
Journal: Thin Solid Films - Volume 472, Issues 1â2, 24 January 2005, Pages 261-269
نویسندگان
O. Hunderi, J.-T. Zettler, K. Haberland,