کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9829714 | 1524497 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Bismuth surfactant growth of the dilute nitride GaNxAs1âx
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The presence of a bismuth surfactant is found to increase the nitrogen incorporation in the dilute nitride GaNxAs1âx by as much as 60% during growth by molecular beam epitaxy. Films with nitrogen concentrations in the 0.4-0.95% range were grown using an RF plasma source for nitrogen. The Bi surface coverage is inferred from reflection high-energy electron diffraction as a function of Bi flux and substrate temperature, and the nitrogen content is obtained by high-resolution X-ray diffraction. At constant substrate temperature the nitrogen content is found to increase with Bi coverage, which has the form of a Langmuir isotherm when plotted as a function of Bi flux.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 279, Issues 3â4, 1 June 2005, Pages 316-320
Journal: Journal of Crystal Growth - Volume 279, Issues 3â4, 1 June 2005, Pages 316-320
نویسندگان
E.C. Young, S. Tixier, T. Tiedje,