Keywords: شبیه سازی تصویر; ADF STEM; Electron scattering; Quantitative STEM; Image simulation;
مقالات ISI شبیه سازی تصویر (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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Keywords: شبیه سازی تصویر; Electron crystallography; Image simulation; Real space method; Bloch wave method; Diagonalization of matrix;
Keywords: شبیه سازی تصویر; HAADF imaging; Spatial coherence; Temporal coherence; Quantitative STEM; Image simulation; III/V semiconductors;
Keywords: شبیه سازی تصویر; SEM; Defect imaging; Electron channeling contrast imaging; Image simulation;
Keywords: شبیه سازی تصویر; Image simulation; Atomistic model; In situ microscopy; Nanoparticle growth;
Keywords: شبیه سازی تصویر; Characteristic curve; Neutron radiography; Transfer method radiography; Image simulation;
Keywords: شبیه سازی تصویر; Cryo-electron microscopy; Phase contrast; Amplitude contrast; Image simulation; InSilicoTEM; Interaction potential;
Dynamical scattering image simulations for two-phase γ-γⲠmicrostructures: A theoretical model
Keywords: شبیه سازی تصویر; Dynamical scattering; Two-phase microstructure; Image simulation; Scattering matrix;
Dr. Probe: A software for high-resolution STEM image simulation
Keywords: شبیه سازی تصویر; STEM; Image simulation; Multislice; Software;
STEMcl-A multi-GPU multislice algorithm for simulation of large structure and imaging parameter series
Keywords: شبیه سازی تصویر; STEM; Image simulation; Multislice; Si; CuZr;
Comparison of Two Simulation Methods in Electron Crystallography: BW Method and a Modified Direct Product Method of Scattering Matrix
Keywords: شبیه سازی تصویر; Electron crystallography; Image simulation; Bethe potential method; Matrix diagonalization;
Atomic resolution imaging of YAlO3: Ce in the chromatic and spherical aberration corrected PICO electron microscope
Keywords: شبیه سازی تصویر; High-resolution transmission electron microscopy; Information limit; Aberration correction; Image simulation; Absolute contrast matching;
Three-dimensional analysis of Eu dopant atoms in Ca-α-SiAlON via through-focus HAADF-STEM imaging
Keywords: شبیه سازی تصویر; Dopant distribution; Through-focus; STEM; HAADF; Phosphor; SiAlON; Image simulation; Aberration correction;
Original ContributionClassic transcrural celiac plexus block simulated on 100 computed tomography images
Keywords: شبیه سازی تصویر; Transcrural celiac plexus block; Classic technique; Image simulation;
Sample tilt effects on atom column position determination in ABF-STEM imaging
Keywords: شبیه سازی تصویر; Annular bright-field imaging; Atom position determination; Sample tilt; Image simulation;
A phantom-based forward projection approach in support of model-based iterative reconstructions for HAADF-STEM tomography
Keywords: شبیه سازی تصویر; High angle annular dark field; Nano-particles; Forward model; Image simulation; Tomographic reconstruction;
Modeling dynamical electron scattering with Bethe potentials and the scattering matrix
Keywords: شبیه سازی تصویر; Dynamical scattering; Bethe potential; Image simulation; 61.05.jd; 61.72.Ff;
Kinematic HAADF-STEM image simulation of small nanoparticles
Keywords: شبیه سازی تصویر; HAADF-STEM; Image simulation; Kinematic scattering; Small particles;
Benchmark test of accelerated multi-slice simulation by GPGPU
Keywords: شبیه سازی تصویر; Multi-slice; GPU; Benchmark; Image simulation; TEM; STEM;
Quantitative STEM normalisation: The importance of the electron flux
Keywords: شبیه سازی تصویر; ADF STEM; Electron scattering; Quantitative STEM; Image simulation; EFW method;
When to use the projection assumption and the weak-phase object approximation in phase contrast cryo-EM
Keywords: شبیه سازی تصویر; Cryo-electron microscopy; Exit waves; Image simulation; Thick-phase grating; Interaction potential;
Validities of three multislice algorithms for quantitative low-energy transmission electron microscopy
Keywords: شبیه سازی تصویر; Image simulation; Multislice method; High-energy approximation; Low-energy electron microscopy;
Mesoscopic properties of interfacial ordering in amorphous germanium on Si(111) determined by quantitative digital image series matching
Keywords: شبیه سازی تصویر; High-resolution electron microscopy (HREM); Crystalline–amorphous interfaces; Image simulation; Bond-angle distribution
In situ structural analysis of crystalline Fe–Mo–C nanoparticle catalysts during the growth of carbon nanotubes
Keywords: شبیه سازی تصویر; Environmental transmission electron microscopy; In situ observation; Image simulation; Nanoparticle; Carbon nanotube
An accurate multislice method for low-energy transmission electron microscopy
Keywords: شبیه سازی تصویر; Image simulation; Multislice method; Real space method; High-energy approximation
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. Point spread function analysis
Keywords: شبیه سازی تصویر; Scanning confocal electron microscopy; SCEM; Point spread function; Contrast transfer function; PSF; CTF; Optical sectioning; Multislice method; Image simulation
Simulation of Sentinel-3 images by four-stream surface-atmosphere radiative transfer modeling in the optical and thermal domains
Keywords: شبیه سازی تصویر; Top-of-atmosphere; Image simulation; Radiative transfer; Sentinel-3; Optical; Thermal; SLC; MODTRAN;
Diffraction contrast STEM of dislocations: Imaging and simulations
Keywords: شبیه سازی تصویر; STEM; Defect imaging; Image simulation; Diffraction contrast;
A method to determine the local surface profile from reconstructed exit waves
Keywords: شبیه سازی تصویر; Defocus; Electron scattering; Channelling theory; Crystalline structure; Image simulation;
On the optimum probe in aberration corrected ADF-STEM
Keywords: شبیه سازی تصویر; STEM; ADF-STEM; ABF-STEM; Aberration corrector; Image simulation; Probe
Accurate modeling of single-particle cryo-EM images quantitates the benefits expected from using Zernike phase contrast
Keywords: شبیه سازی تصویر; Zernike phase contrast; Cryo-electron microscopy; Multislice; Image simulation; Heterogeneity;
Simulation of scanning transmission electron microscope images on desktop computers
Keywords: شبیه سازی تصویر; STEM; Image simulation; Multislice
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy
Keywords: شبیه سازی تصویر; Confocal electron microscopy; Confocal STEM; SCEM; Optical sectioning; Multislice method; Image simulation; 3D STEM
Quantitative HRTEM investigation of nanoplatelets
Keywords: شبیه سازی تصویر; 68.37.Og; 61.72.ây; 31.15.A; 81.05.Cy; HRTEM; Image analysis; Image simulation; Crystal defects;
Direct structure inversion from exit waves
Keywords: شبیه سازی تصویر; Argand plot; Electron scattering; Channelling theory; Structure determination; Image simulation;
SimulaTEM: Multislice simulations for general objects
Keywords: شبیه سازی تصویر; Electron diffraction; Multislice; Image simulation; High resolution electron microscopy
Material contrast in SEM: Fermi energy and work function effects
Keywords: شبیه سازی تصویر; Secondary electron emission; Scanning electron microscopy; Image simulation; Material and doping contrast; Semiconductors and semiconducting devices
Computational comparison of the conventional multislice method and the real space multislice method for simulating exit wavefunctions
Keywords: شبیه سازی تصویر; Image simulation; Multislice method; Exit wavefunction; High-order Laue zone effect
Image simulation of high resolution energy filtered TEM images
Keywords: شبیه سازی تصویر; 61.05.jd; 61.85.+p; 68.37.Ma; 79.20.Uv; Image simulation; Inelastic scattering; Coherence; EELS; EFTEM;
Half analytical method with application to the high order Laue zone effects in monoclinic and triclinic crystals
Keywords: شبیه سازی تصویر; Image simulation; Monoclinic and triclinic crystals; Multislice method; Exit wavefunction; High order Laue zone effect
High-pressure polymorphic transformation of rutile to α-PbO2-type TiO2 at {0 1 1}R twin boundaries
Keywords: شبیه سازی تصویر; Rutile twin; α-PbO2-type TiO2; Phase transformation; Image simulation
On some contrast reversals in SEM: Application to metal/insulator systems
Keywords: شبیه سازی تصویر; 79.20 Hx; 61.16 Bg; 81.80.−b; .85–40.−eSecondary electron emission; Scanning electron microscopy; Image simulation; Material contrast; Topographic contrast; Charging contrast; SEM metrology and testing
Bloch wave-based calculation of imaging properties of high-resolution scanning confocal electron microscopy
Keywords: شبیه سازی تصویر; 68.37.Ma; 87.64.Ee; 87.64.mkConfocal electron microscopy; Confocal STEM; SCEM; Optical sectioning; Bloch wave method; Image simulation; 3D STEM
3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography
Keywords: شبیه سازی تصویر; 42.30.Wb; 42.30.Rx; 61.46.Hk; 68.37.Lp; Atomic resolution electron tomography; Discrete tomography; Image simulation; Exit wave reconstruction; Electron crystallography; Gold nanocrystal; Tilt experiment;
Electron channelling based crystallography
Keywords: شبیه سازی تصویر; 61.14.Dc; 61.16.BgTheories of diffraction and scattering; Transmission; Reflection and scanning electron microscopy; Electron diffraction and elastic scattering theory; Image simulation
EFTEM assistant: A tool to understand the limitations of EFTEM
Keywords: شبیه سازی تصویر; 79.20.Uv; 68.37.Lp; 42.30.WbEFTEM; Image simulation; Digital micrograph; Script; Software; Delocalization; Drift
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
Keywords: شبیه سازی تصویر; 68.37.Lp; 02.70.−cHigh-resolution transmission electron microscopy; Image simulation
Construction of synthetic spectral reflectance of remotely sensed imagery for planning purposes
Keywords: شبیه سازی تصویر; Image simulation; Spectral mixing; Value adding; Planning
Interface structure between epitaxial NiSi2 and Si
Keywords: شبیه سازی تصویر; nickel silicide; interface; high resolution; image simulation; atomic structure;
Interference electron microscopy of one-dimensional electron-optical phase objects
Keywords: شبیه سازی تصویر; 07.05.Tp; 42.25.−p; 68.37.Lp; 95.75.Kk; 73.40.Lq; 75.60.ChTransmission electron microscopy; Electron interferometry; Image simulation; p–n junctions; Magnetic domains