کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10669652 1008781 2014 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
How spectroscopic ellipsometry can aid graphene technology?
ترجمه فارسی عنوان
چگونه بیضه سنجی طیف سنجی می تواند به تکنولوژی گرافن کمک کند؟
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
We explore the effects of substrate, grain size, oxidation and cleaning on the optical properties of chemical vapor deposited polycrystalline monolayer graphene exploiting spectroscopic ellipsometry in the NIR-Vis-UV range. Both Drude-Lorentz oscillators' and point-by-point fit approaches are used to analyze the ellipsometric spectra. For monolayer graphene, since anisotropy cannot be resolved, an isotropic model is used. A prominent absorption peak at approximately 4.8 eV, which is a mixture of π-π* interband transitions at the M-point of the Brillouin zone and of the π-plasmonic excitation, is observed. We discuss the sensitivity of this peak to the structural and cleaning quality of graphene. The comparison with previous published dielectric function spectra of graphene is discussed giving a rationale for the observed differences.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 571, Part 3, 28 November 2014, Pages 389-394
نویسندگان
, , , , ,