Structure and microwave dielectric properties of Bi1.5Zn1.0Nb1.5O7 thin films deposited on alumina substrates by pulsed laser deposition

► Bi1.5Zn1.0Nb1.5O7 BZN thin films were deposited on polycrystalline alumina substrates. ► Dielectric properties were evaluated by split-post dielectric resonator method. ► BZN films exhibit excellent dielectric properties in the microwave frequency range. ► The dielectric constant of crystallized BZN films is 154 at 10 GHz