کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10670427 | 1008866 | 2011 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods](/preview/png/10670427.png)
چکیده انگلیسی
Spectroscopic ellipsometry (SE) and quartz crystal microbalance with dissipation (QCM-D) techniques have been extensively used as independent surface characterization tools to monitor in-situ thin film formation. They provide different information for ultra-thin films because QCM-D is sensitive to the solvent content while SE is not. For using these two techniques in tandem, we present a virtual separation approach to enable the determination of both ultra-thin film thickness and porosity. Assumptions for the intrinsic molecular polarizability (index of refraction no) and density (Ïo) of the organic adsorbent must be made, and the consequences for these parameters' values are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 519, Issue 9, 28 February 2011, Pages 2772-2776
Journal: Thin Solid Films - Volume 519, Issue 9, 28 February 2011, Pages 2772-2776
نویسندگان
K.B. Rodenhausen, M. Schubert,