کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1664310 1518010 2016 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Subthreshold slope as a measure of interfacial trap density in pentacene films
ترجمه فارسی عنوان
شیب زیرین به عنوان اندازه گیری تراکم تله چاه در فیلم های پنتان
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی


• Sub-threshold slope is demonstrated to be a measure of interface traps.
• For application to sensors, effective charge transport layer should be chosen.
• Monolayer transistors can be used as a platform for probing localized states.

Electrical properties in organic field effect transistors (FETs) are dominated by charge transport in the accumulation layer, few molecular layers close to the gate dielectric. Through comparison of the subthreshold slope between monolayer (ML) and thick pentacene FETs, formation of the second layer islands on top of the complete first layer is found to be crucial in determining the charge transport in ML pentacene FETs. It is demonstrated that a pentacene ML field effect transistor (FET) is an excellent probe that can detect electronic states of organic semiconductors interfacing with the gate dielectric at nanometer scale. Far higher sub-threshold slope in ML FETs, as a measure of interfacial charge trap density, than that in thick pentacene FETs is translated that the path of the induced carriers in ML FETs is limited into the molecular layer interfacing with the gate dielectric with a high density of charge traps, while carriers in thicker films have alternative pathways through more electrically conductive layer above the first layer with much less trap density.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 599, 29 January 2016, Pages 145–150
نویسندگان
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