کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1666073 1518064 2013 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Forming time of conducting channels in double-layer Pt/Ta2O5/TaOx/Pt and single-layer Pt/TaOx/Pt resistance memories
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Forming time of conducting channels in double-layer Pt/Ta2O5/TaOx/Pt and single-layer Pt/TaOx/Pt resistance memories
چکیده انگلیسی


• We measured the forming time in double-layer and single-layer resistance memories.
• The forming times revealed nonlinearities with variation of the applied voltage.
• The forming times decreased with increase of temperature.
• The forming process can be attributed to thermally assisted dielectric breakdown.

Oxide double-layer systems have recently attracted much attention, owing to their excellent performance as nonvolatile bipolar resistance memory. In this study, we measured the time required to form conducting channels (i.e., the forming time) in double-layer Pt/Ta2O5/TaOx/Pt cells and single-layer Pt/TaOx/Pt cells by applying a pulse-waveform voltage signal. The voltage amplitude dependence of forming times in both samples revealed nonlinearities with nine orders of magnitude. By investigating their temperature dependence, we found that channel formation for both samples can be attributed to thermally assisted dielectric breakdown.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 540, 1 July 2013, Pages 190–193
نویسندگان
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