کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1666751 1518084 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Ultra-thin films of polysilsesquioxanes possessing 3-methacryloxypropyl groups as gate insulator for organic field-effect transistors
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Ultra-thin films of polysilsesquioxanes possessing 3-methacryloxypropyl groups as gate insulator for organic field-effect transistors
چکیده انگلیسی

Polysilsesquioxanes (PSQs) possessing 3-methacryloxypropyl groups as an organic moiety of the side chain were synthesized by sol–gel condensation copolymerization of the corresponding trialkoxysilanes. The ultra-thin PSQ film with a radical initiator and a cross-linking agent was prepared by a spin-coating method, and the film was cured integrally at low temperatures of less than 120 °C through two different kinds of polymeric reactions, which were radical polymerization of vinyl groups and sol–gel condensation polymerization of terminated silanol and alkoxy groups. The obtained PSQ film showed the almost perfect solubilization resistance to acetone, which is a good solvent of PSQ before polymerization. It became clear by atomic force microscopy observation that the surface of the PSQ film was very smooth at a nano-meter level. Furthermore, pentacene-based organic field-effect transistor (OFET) with the PSQ film as a gate insulator showed typical p-channel enhancement mode operation characteristics and therefore the ultra-thin PSQ film has the potential to be applicable for solution-processed OFET systems.


► Polysilsesquioxanes (PSQs) possessing 3-methacryloxypropyl groups were synthesized.
► The ultra-thin PSQ film could be cured at low temperatures of less than 120 °C.
► The PSQ film showed the almost perfect solubilization resistance to organic solvent.
► The surface of the PSQ film was very smooth at a nano-meter level.
► Pentacene-based organic field-effect transistor with the PSQ film was fabricated.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 520, Issue 24, 1 October 2012, Pages 7195–7199
نویسندگان
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