کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1667681 | 1008856 | 2011 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structural and electrical properties of BiFeO3 thin films by solution deposition and microwave annealing
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Lead-free polycrystalline BiFeO3 (BFO) thin films were developed using a chemical solution deposition method to deposit the films and the multi-mode 2.45 GHz microwave furnace to optimize the annealing condition of the films. Phase-pure BFO films were obtained at 500 °C–600 °C for 1–5 min with a heating rate of 10 °C/min. The film by microwave annealing (MW) at 550 °C for 5 min exhibited a (012)-preferred orientation with a dense morphology of grain size ~ 294 nm. Its dielectric constant of 96.2, low leakage current density of 2.466 × 10− 6 A/cm2, polarization (2Pr) and coercive field (2Ec) of 0.931 μC/cm2 and 57.37 kV/cm, respectively, were improved compared to those by conventional annealing (CA) at the same annealing conditions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 519, Issue 15, 31 May 2011, Pages 4793–4797
Journal: Thin Solid Films - Volume 519, Issue 15, 31 May 2011, Pages 4793–4797
نویسندگان
A. Huang, S.R. Shannigrahi,