کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1668120 1008863 2011 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Role of the crystallinity of ZnO films in the electrical properties of bottom-gate thin film transistors
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Role of the crystallinity of ZnO films in the electrical properties of bottom-gate thin film transistors
چکیده انگلیسی

The strong correlation between the microstructural characteristics of ZnO channel layers grown at various temperatures by radio-frequency magnetron sputtering and the electrical performances of resulting bottom-gate thin film transistors (TFTs) was reported. Transmission electron microscopy revealed that increasing growth temperature enhanced degree of c-axis preferred orientation and enlarged width of columns in the ZnO films. The ZnO channel layers grown at 250 and 350 °C exhibited TFT saturation behavior. However, growing them at ≥ 350 °C produced small grains in the junctions of ZnO/SiO2 interface and grain boundaries, which led to hump behavior in TFT transfer curve caused by formation of additional boundaries.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 519, Issue 20, 1 August 2011, Pages 6801–6805
نویسندگان
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