کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1668895 | 1008876 | 2011 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Growth, structure and electronic properties of ultrathin cerium oxide films grown on Pt(111)
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Growth, structure and electronic properties of ultrathin cerium oxide films grown on Pt(111) Growth, structure and electronic properties of ultrathin cerium oxide films grown on Pt(111)](/preview/png/1668895.png)
چکیده انگلیسی
Ultrathin cerium oxide films have been prepared by oxidizing Ce-Pt/Pt(111) surface alloys with 65 L O2 at 900Â K. According to low electron energy diffraction data, phonon spectra recorded by high resolution electron energy loss spectroscopy and scanning tunneling microscopy measurements the films are of fluorite-type CeO2(111) structure. They grow three dimensionally as islands, which are flat and up to several hundred square nanometers large. The film thickness varies between one and five layers. The band gap of the oxide films has been probed by scanning tunneling spectroscopy and turned out to be significantly smaller than for bulk CeO2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 519, Issue 11, 31 March 2011, Pages 3752-3755
Journal: Thin Solid Films - Volume 519, Issue 11, 31 March 2011, Pages 3752-3755
نویسندگان
Christian Breinlich, Jan Markus Essen, Enrico Barletta, Klaus Wandelt,