کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1669142 1008879 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope
چکیده انگلیسی

A near-field scanning microwave microprobe (NSMM) technique has been used to investigate the magnetic properties of the Permalloy (Ni81Fe19) thin film. To characterize the hysteresis behavior of the magnetoresistance (MR) of Permalloy (Py) thin films, the microwave reflection coefficient, S11 was measured. The change of the estimated MR was observed under in-plane external magnetic fields, and was confirmed with variation of MR measured by the 4-probe method. The magnetic properties of the Py thin film were examined by a vibrating sample magnetometer. The observed MR was correlated with the changes of the relative magnetic permeability, Δμ of the Py. We also directly imaged the Py thin film changes by NSMM. MR of Py was determined from the visualized microwave reflection coefficient changes ΔS11 at the thin film interface with high sensitivity. The present methodology can be extended to investigations of other magnetic thin films or magnetic materials using the NSMM system.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 519, Issue 1, 29 October 2010, Pages 399–403
نویسندگان
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