کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1670087 | 1008895 | 2010 | 6 صفحه PDF | دانلود رایگان |

P- and n-type channel thin film transistors (OTFTs) were fabricated by using hexadecahydrogen copper phthalocyanine (H16CuPc) and hexadecafluoro copper phthalocyanine (F16CuPc) molecules, respectively. Top-contact and bottom-contact source-drain configurations were used for both semiconductors. Furthermore, the temperature and film thickness dependences on the mobility values were measured in the saturation regime of source-drain current. Unipolar mobilities in such single-layer OTFTs were correlated to thin film morphology by X-ray diffraction analysis and atomic force microscopy measurements. Shelf-life time tests of p-type and n-type OTFTs are detailed as OTFT configuration and substrate temperature dependence over a time period of 100 days.
Journal: Thin Solid Films - Volume 518, Issue 19, 30 July 2010, Pages 5593–5598