کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1670115 | 1008896 | 2008 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of the reaction film formed by zinc dialkyldithiophosphate using two different ellipsometric analyses
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Two functionally different ellipsometry, spectroscopic ellipsometry (SE) and color-imaging ellipsometry (CIE) were employed to measure the thickness of film formed by zinc dialkyldithiophosphate on a steel surface during a friction test. In SE, the optical constants of the film were parameterized by one Lorentz oscillator, and the film thickness was then determined to be approximately 110 nm by regression-fitting of the data generated by the oscillator model to the experimental data. In CIE, the intensity of the reflected light from the film was converted to the distribution of the film thickness. Quantification of distribution of thickness provided much information regarding the morphology and topography of the film.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 2, 28 November 2008, Pages 560–567
Journal: Thin Solid Films - Volume 517, Issue 2, 28 November 2008, Pages 560–567
نویسندگان
Saiko Aoki, Akihito Suzuki, Masabumi Masuko,