کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1670533 1008901 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Highly doped Si and Ge formed by GILD (gas immersion laser doping); from GILD to superconducting silicon
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Highly doped Si and Ge formed by GILD (gas immersion laser doping); from GILD to superconducting silicon
چکیده انگلیسی

Gas Immersion Laser Doping (GILD) of silicon with boron has shown excellent performances in terms of junction depth, box-like profile, dopant concentration and activation. The study of the GILD process is extended to boron and phosphorus doping of silicon on insulator (SOI) and of relaxed Ge films epitaxied on Si or on SOI. The sheet resistances of Si and Ge doped films are measured as a function of the laser energy density and number of laser pulses. The dopant concentration profiles are measured by Secondary Ion Mass Spectrometry (SIMS) in the case of Ge on SOI. Experimental results on Ge show that GILD allows realizing doped layers with sheet resistances of ≈ 10 Ω/□ with nearly boxlike depth profiles, in the case of phosphorus, and of ≈ 40 Ω/□ with depth profiles peaked near the interface of the undoped Ge, in the case of boron. Finally we show that B doping by GILD allows reaching high enough dopant concentrations to make cubic silicon superconductive.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 1, 3 November 2008, Pages 75–79
نویسندگان
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