کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1671367 1008915 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
First-principles study of near surface point defects stability in Si (100) and SiGe(100)
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
First-principles study of near surface point defects stability in Si (100) and SiGe(100)
چکیده انگلیسی

Calculations based on Density Functional Theory are carried out to study interstitial generation close to the Si(100) surface with further consideration of effects related to the presence of substitutional Ge atoms on the surface. Defect structures, vacancy and Si interstitial, and associated energies are calculated. We observe that germanium atoms tend to increase the stability of created defects, promote the generation of interstitials through drastic structural changes and blocks the climb of Si interstitials towards the surface.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 9, 26 February 2010, Pages 2418–2421
نویسندگان
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