کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1671592 | 1008920 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra Extraction of the refractive index profile of thin transparent conductive oxide films from the analysis of reflectance optical spectra](/preview/png/1671592.png)
چکیده انگلیسی
In the direction of growth of fabricated films, the material near the free surface as well as the interface with the substrate exhibits properties which are different from those of the material in the bulk. The resulting spatial inhomogeneity of the refractive index influences positions and values of the extrema of optical spectra. We exploit this to derive the profile of the refractive index by developing a theoretical approach. In the calculations, taking the derived profile into account, we attain a good reproduction of the experimental Transmittance and Reflectance spectra from approximately 1 to 4 eV, the region of relatively weak refractive-index dispersion.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 24, 15 October 2007, Pages 8586–8589
Journal: Thin Solid Films - Volume 515, Issue 24, 15 October 2007, Pages 8586–8589
نویسندگان
A. Kondilis, E. Aperathitis, M. Modreanu,