کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1671949 | 1008926 | 2009 | 6 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Chemistry of post-annealing of epitaxial CoFe2O4 thin films Chemistry of post-annealing of epitaxial CoFe2O4 thin films](/preview/png/1671949.png)
CoFe2O4 thin films of different thicknesses were grown on SrTiO3 substrates. The X-ray diffraction analysis and atomic force microscopy indicated both epitaxy and a granular microstructure. We studied the magnetic properties of these films as a function of oxygen post-annealing and film thickness. All as-deposited films exhibited similar magnetic properties with saturated magnetization (Ms) of approximately 50% of the bulk Ms, (80 Am2 kg− 1). After the post-annealing the Ms changes as a consequence of crystallographic restructuring of the film. Cation ordering in 100 nm thick films reduces Ms, whereas re-oxidation increases Ms for thinner films. 13 nm films, annealed for 1 h, reach the bulk Ms. For even thinner films the quantum-size effect reduces Ms. For a synthesis of ≥ 30 nm films an annealing cycle after deposition of every 15 nm layer is recommended.
Journal: Thin Solid Films - Volume 517, Issue 13, 1 May 2009, Pages 3742–3747