کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1673426 1008948 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Optical constants of electroplated Bi2Te3 films by Mueller matrix spectroscopic ellipsometry
چکیده انگلیسی

We synthesized polycrystalline Bi2 + xTe3 − x (− 0.2< x <0.2) thin films by electrodeposition in acidic medium. Since Bi2Te3-like structure may be uniaxially anisotropic due to its rhombohedral crystallographic system, we investigated their optical behavior using ex and in situ Mueller matrix spectroscopic ellipsometry in the wavelength range of 470 to 830 nm (1.5–2.6 eV). We found that room-temperature electroplated polycrystalline appears optically isotropic and that no depolarization effect occurs from the first steps of growth until several micrometers thick films. Additional ex situ measurements permit to obtain their optical constants from far-ultraviolet to near-infrared (190–2100 nm).

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 10, 31 March 2008, Pages 2922–2927
نویسندگان
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