کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1673508 1008948 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Semimetal–semiconductor transition in thin Bi films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Semimetal–semiconductor transition in thin Bi films
چکیده انگلیسی

The temperature dependences of the Hall coefficient of thin bismuth films with thicknesses d = 8 to 215 nm prepared by thermal evaporation in vacuum on mica substrates were obtained in the temperature range 80–300 K. It was established that at thicknesses smaller than ∼ 25–30 nm, semimetallic conductivity is not observed. It was suggested that in this thickness range a semimetal–semiconductor transition occurs. Using this assumption and taking into account the existence of surface states, it was shown that the gap between the valence and conduction bands in the semiconductor region increases with decreasing d.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 10, 31 March 2008, Pages 3411–3415
نویسندگان
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