کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1674065 1008957 2008 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Characterization of ferroelectric/metal interface under the repeated polarization switching
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Characterization of ferroelectric/metal interface under the repeated polarization switching
چکیده انگلیسی
Polarization fatigue mechanism in organic ferroelectrics, structures at interface between ferroelectric vinylidene fluoride oligomer and Al electrode under the repeated polarization switching process were investigated by high-resolution X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FT-IR). Al2O3 layer at interface was formed with increasing the number of polarization reversal. The formation of oxide layer will be strongly related to polarization reversal, thus the repeated charge and discharge process by polarization reversal may promote the oxidation of Al electrode. Furthermore, the structural and orientation changes in ferroelectric molecular films by applying the electric field were observed. The formation of Al2O3 layer, as well as the structural changes in thin films, is affected to polarization fatigue process of ferroelectric organic devices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 9, 3 March 2008, Pages 2450-2453
نویسندگان
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