کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1675130 | 1518092 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigation of microstructure of Nd-Fe-B/Ta multilayered films by scanning transmission electron microscopy
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The effect of Co addition on microstructures of Nd-Fe-B/Ta multilayered films was investigated by scanning transmission electron microscopy. It was found that fine Nd2Fe14B grains with a mean diameter of less than 100 nm grew to columnar structures and their c-axes were preferentially oriented perpendicular to the film plane, and that these states were more pronounced in the Co-doped film. It was also found that pure Nd and Nd-rich phases precipitated and distributed in the Nd2Fe14B layer, and that more pure Nd phases precipitated in the Co-doped film. Moreover, discontinuity of the Ta layer and the occurrence of voids were observed and it was presumed that the crystallization of Nd2Fe14B started with a slight delay after the deposition of the film had been completed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 509, Issues 1â2, 19 June 2006, Pages 102-106
Journal: Thin Solid Films - Volume 509, Issues 1â2, 19 June 2006, Pages 102-106
نویسندگان
Norio Gennai, Minoru Uehara, Makoto Fujiwara, Takeo Tanaka,