کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1675132 1518092 2006 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Micrometer-scale fabrication and assembly using focused ion beam
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Micrometer-scale fabrication and assembly using focused ion beam
چکیده انگلیسی

As nanotechnology advances, fabrication techniques based on focused ion beams (FIB) are expected to be useful in manufacturing complex microstructures. We developed a micro-manufacturing method with superior micro-assembly capability by employing FIB milling, FIB-assisted deposition, a rotational-type side-entry stage, and a micro-sampling system. After being machined by FIB milling, micro-samples were assembled into a 25-μm-diameter micro universal joint. A 1-μm-diameter micro-joint was also successfully manufactured in the same manner. Results of TEM observation of the interface between the deposited layer and the substrate suggest that FIB-assisted deposition can be applied to the formation of micro-joints in a micro-machine manufacturing process. This micro-manufacturing method is a powerful tool for the fabrication and assembly of micro-machines.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 509, Issues 1–2, 19 June 2006, Pages 113–117
نویسندگان
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