کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1675800 1008984 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Effects of texture and residual stress on the transition of ferroelectric perovskite thin films with C-axis polarization
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Effects of texture and residual stress on the transition of ferroelectric perovskite thin films with C-axis polarization
چکیده انگلیسی

Based on the Landau–Devonshire theory, the effects of texture and residual stress on the transition of ferroelectric perovskite thin films with C-axis polarization were studied where the influence of texture dispersion was considered. Using the results, the effect of residual stress on the transition temperature of textured ferroelectric film can be predicted. As an example, the influence rules of residual stress on the PbTiO3 films with various texture types and degrees were obtained. For (001)-oriented PbTiO3 film, the compressive stress increases the transition temperature, but tensile stress decreases the transition temperature. And the shift of the transition temperature increases with the texture degree increasing for both compressive stress and tensile stress in (001)-oriented PbTiO3 films. For (111)-oriented PbTiO3 film, the effects of stresses for different texture degrees on the transition temperature are different from that for (001)-oriented PbTiO3 film. At the same residual stress level, the shift of the transition temperature in (001)-oriented PbTiO3 film is greater than that in (111)-oriented PbTiO3 film.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 516, Issue 6, 30 January 2008, Pages 1265–1270
نویسندگان
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