کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1675966 1518088 2006 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray diffraction studies of the structure and orientations of thiophene and fluorenone based molecule
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
X-ray diffraction studies of the structure and orientations of thiophene and fluorenone based molecule
چکیده انگلیسی
The crystal structure of a conjugated molecule containing thiophene and fluorenone residues has been determined from powder X-ray diffraction (XRD). Thin films (< 40 nm thick) of this molecule, grown in high vacuum (10− 5 Pa) onto oxidized silicon substrates, are oriented along with different crystallographic directions. A comparison of XRD in both Grazing Incidence and Bragg-Brentano geometries allowed to perform a quantitative analysis of the various orientations. This approach is generally applicable in the case of multi-oriented films. The results fully account for the poor performance of this molecule in p-type field effect transistor devices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 514, Issues 1–2, 30 August 2006, Pages 334-340
نویسندگان
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